Bayesian monitoring to detect a shift in process mean |
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| Authors: | Richard L. Marcellus |
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| Affiliation: | Industrial and Systems Engineering, Northern Illinois University, DeKalb, IL 60115, U.S.A. |
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| Abstract: | A Bayesian analogue of the Shewhart X‐bar chart is defined and compared with cumulative sum charts. The comparison identifies types of production process where the Bayesian chart has better expected performance than the cumulative sum chart. Implementing the Bayesian chart requires more detailed knowledge of the process structure than is required by the best‐known types of charts, but acquiring this information can yield tangible benefits. Copyright © 2007 John Wiley & Sons, Ltd. |
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| Keywords: | Bayesian statistical process control control charts |
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