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CHARACTERIZATION OF NANOSTRUCTURED MATERIALS BY ANALYTICAL ELECTRON MICROSCOPY
作者姓名:L.D. He  G.Y Zeng  X.Liu H.S. Hu  D.Song and L.Z.Cheng
作者单位:Electron Microscope Laboratory Northeastern University Shenyang 110006,China
摘    要:CHARACTERIZATIONOFNANOSTRUCTUREDMATERIALSBYANALYTICALELECTRONMICROSCOPY¥L.D.He,G.YZeng,X.LiuH.S.Hu,D.SongandL.Z.Cheng(Electro...

收稿时间:1996-08-25
修稿时间:1996-08-25

CHARACTERIZATION OF NANOSTRUCTURED MATERIALS BY ANALYTICAL ELECTRON MICROSCOPY
L.D. He,G.Y Zeng,X.Liu H.S. Hu,D.Song and L.Z.Cheng.CHARACTERIZATION OF NANOSTRUCTURED MATERIALS BY ANALYTICAL ELECTRON MICROSCOPY[J].Acta Metallurgica Sinica(English Letters),1996,9(4):279-282.
Authors:LD He  GY Zeng  XLiu HS Hu  DSong and LZCheng
Abstract:The analytical electron microscopy has been used to characterize the morphology,structure and composition of the nanostructured material of Sn- Bi alloy prepared by a modified electrohydrodynamic technique. The electron diffraction pattern and the corresponding contrast image for the discrete particles with a diameter smaller than 4 nm have been obtained.It is shown that the nanocrystalline Sn-Bi alloy particles comprise a single crystal of Bi-containing β-Sn solid solution or of Sn-containing Bi solid solution. A direct preparation procedure of the samples during the electrohydrodynamic rapid solidification process has been developed for electron microscopic observation.
Keywords:nanostructured material  electrohydrodynamic technique  analytical electron microscopy  Sn-Bi alloy
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