| 基于JTAG的ARM芯片系统调试 |
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| 引用本文： | 杨峰,张根宝,田泽,万永波. 基于JTAG的ARM芯片系统调试[J]. 微计算机信息, 2005, 0(22) |
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| 作者姓名： | 杨峰 张根宝 田泽 万永波 |
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| 作者单位： | 陕西科技大学电气与电子工程学院 712081陕西咸阳(杨峰，张根宝，万永波)，西北大学电子科学系 710069陕西西安(田泽) |
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| 基金项目： | 陕西省教育厅产业化培育项目,项目编号:04JC07 |
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| 摘 要： | 嵌入式ARM软、硬件调试技术依赖于ARM处理器调试硬件,本文在分析JTAG边界扫描结构的基础上,介绍了EmbeddedICE、嵌入式跟踪等实时调试技术,并给出了一个嵌入式调试开发系统的实例。
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| 关 键 词： | ARM JTAG Embedded ICE 嵌入式跟踪 |
The Debug Technology for ARM Microprocessors based on JTAG |
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| Yang,Feng Zhang,GenbaoWan,Yongbo Tian,Ze. The Debug Technology for ARM Microprocessors based on JTAG[J]. Control & Automation, 2005, 0(22) |
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| Authors: | Yang Feng Zhang GenbaoWan Yongbo Tian Ze |
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| Affiliation: | (College of Electric and Electronic Engineering,ShaanXi University of Science and Technology,Xi-anyang 712081,China)Yang,Feng Zhang,GenbaoWan,Yongbo(Department of Electronics Science,Northwest Uni-versity,Xi' an 710069,China) Tian,Ze |
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| Abstract: | The debug technology for embedded software and hard-ware of ARM depends on the ARM processor' s debug hard-ware. First analyzing the structure of JTAG boundary- scan cir-cuit,this paper introduced the debug technology of Embed-dedICE,Embedded trace and so on. In the end,an embeddeddebug development system is illustrated as an example. |
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| Keywords: | ARM JTAG EmbeddedICE Embedded Trace |
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