| 镀层和氧化膜厚度的显微镜测量技术 |
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| 引用本文： | 张德忠. 镀层和氧化膜厚度的显微镜测量技术[J]. 电镀与环保, 2006, 26(6): 33-35 |
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| 作者姓名： | 张德忠 |
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| 作者单位： | 武汉材料保护研究所,湖北,武汉,430030 |
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| 摘 要： | 对GB/T 6462-2005进行了简单介绍,着重介绍了显微镜法测量镀层和氧化膜厚度的原理、测量仪器和操作步骤、测量不确定度及其控制等,同时对横断面的制备进行了补充说明.该方法的突出特点是直观、重现性好,因而常用于仲裁,或检测精度要求较高的产品和校验其它测厚方法.
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| 关 键 词： | 电镀 氧化膜 厚度测量 显微镜 |
| 文章编号： | 1000-4742（2006）06-0033-03 |
| 收稿时间： | 2006-04-27 |
| 修稿时间： | 2006-04-27 |
Measurement of Coating and Oxide Film Thickness by Microscopical Method |
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| ZHANG De-zhong. Measurement of Coating and Oxide Film Thickness by Microscopical Method[J]. Electroplating & Pollution Control, 2006, 26(6): 33-35 |
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| Authors: | ZHANG De-zhong |
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| Affiliation: | Wuhan Research institute of Materials Protection, Wuhan 430030, China |
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| Abstract: | GB/T 6462-2005 is introduced briefly with focus on its principle,measuring equipments,process,measurement uncertainty,controls,etc.Additional explanation is also made on the cross-section preparation.This method is characterized by direct-viewing,good repeatability,therefore usually used for arbitration,or to examine high precision products and calibrate other thickness measuring methods. |
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| Keywords: | coating oxide film thickness measurement microscope |
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