组合电路测试生成的任意路径敏化法

本文阐述了基于布尔函数的组合电路测试生成方法，给出了测试生成的基本运算规则及测试生成的算法－任意路径敏化法，该算法适用于布尔函数的任何表示形式，与基于布尔函数的其它算法相比，该算法不用复杂的布尔运算。只须按给出的规则作简单的判断和计算就可以生成给定邦联伯测试码，因而计算工作要小得多，该算法用于大型组合电路的测试生成，可以增加扇出分支处的一敏化条件。减少信号冲突和回溯次数。大大加快了大规模组合电路以及印制电路板的测试生成速度。

Any Paths sensitization Algorithm for Test Generation for Combinational Circuits

Test generation algorithm for combinational circuits based on Boolean function was expounded, the basic calculation rule and a test generation algorithm, i. e. any paths sensitization algorithm was given in this paper. The algorithm is applicable to any form of Boolean function. The calculation workload for this algorithm is far smaller compared with other algorithms that based on Boolean function. It needn' t complex Boolean operation. It can generate test set for given faults only by simply judgment and calculation. This algorithm can increase only sensitization condition in fan -out point and decrease signal conflict to decrease trace so as to accelerate test generation for large scaled combinational circuit and printed Circuit Board.