| 失效个数极小情况下某继电产品的可靠性评定 |
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| 引用本文： | 刘宏林,刘华,等.失效个数极小情况下某继电产品的可靠性评定[J].武汉化工学院学报,2001,23(1):70-71,74. |
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| 作者姓名： | 刘宏林 刘华 |
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| 作者单位： | [1]大庆石化总厂计算机开发公司，黑龙江163700 [2]阿城继电器股份有限公司，黑龙江阿城150200 |
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| 摘 要： | 为了解决在Weibull单元的某继电产品寿命试验中无失效数据或失效数据级小情况下的可靠性评定问题，应用Bayes方法，研究了可靠性下降和可靠寿命下降的解法，结果可适用于寿命试验或加速寿命实验中的II型截尾和I型截尾。
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| 关 键 词： | Weibull分布 可靠性分析 寿命试验 继电产品 |
| 文章编号： | 1004-4736(2001)01-0070-02 |
Reliability assessment of
some relay products' life test with none or minimal failures |
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| LIU Honglin ,LIU Hua ,ZHANG Keli ,ZHANG Yanduo.Reliability assessment of
some relay products' life test with none or minimal failures[J].Journal of Wuhan Institute of Chemical Technology,2001,23(1):70-71,74. |
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| Authors: | LIU Honglin LIU Hua ZHANG Keli ZHANG Yanduo |
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| Affiliation: | LIU Honglin 1,LIU Hua 2,ZHANG Keli 2,ZHANG Yanduo 3 |
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| Abstract: | For solving the problem of some relays' reliability assessment while none or minimum failure occurred during its life test, bayes method is used, the algorithm of reliability limit and reliable life limit is given. And the result is efficient for type II or I of life/lifeacceleration test. |
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| Keywords: | weibull distribution reliability assessment life experiment |
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