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A Model for Burn-In Programs for Components with Eliminateable Defects
Authors:Dishon  Menachem Weiss  George H
Affiliation:Weizmann Institute of Science//Rehovot, Israel;
Abstract:We consider a component with a random number of defects which can be discovered and corrected during the course of a burn-in program. The failure rate after burn-in is constant (in time) and depends on the number of remaining defects. A sufficient condition is given for a burn-in program to lead to increased mean time to failure; it is given in terms of the prior distribution of the number of defects and the failure rates.
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