首页 | 本学科首页   官方微博 | 高级检索  
     


Reliable eye-diagram analysis of data links via device macromodels
Authors:Stievano   I.S. Maio   I.A. Canavero   F.G. Siviero   C.
Affiliation:Dipt. di Elettronica, Politecnico di Torino, Italy;
Abstract:This paper addresses the impact of device macromodels on the accuracy of signal integrity and performance predictions for critical digital interconnecting systems. It exploits nonlinear parametric models for both single-ended and differential devices, including the effects of power supply fluctuations and receiver bit detection. The analysis demonstrates that the use of well-designed macromodels dramatically speeds up the simulation as well it preserves timing accuracy even for long bit sequences.
Keywords:
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号