Reliable eye-diagram analysis of data links via device macromodels |
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Authors: | Stievano I.S. Maio I.A. Canavero F.G. Siviero C. |
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Affiliation: | Dipt. di Elettronica, Politecnico di Torino, Italy; |
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Abstract: | This paper addresses the impact of device macromodels on the accuracy of signal integrity and performance predictions for critical digital interconnecting systems. It exploits nonlinear parametric models for both single-ended and differential devices, including the effects of power supply fluctuations and receiver bit detection. The analysis demonstrates that the use of well-designed macromodels dramatically speeds up the simulation as well it preserves timing accuracy even for long bit sequences. |
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