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Boundary condition and initial value effects in the reaction-diffusion model of interface trap generation/recovery |
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| Authors: | Luo Yong Huang Daming Liu Wenjun Li Mingfu |
| Affiliation: | 1. State Key Laboratory of ASIC & System, Department of Microelectronics, Fudan University, Shanghai 201203, China 2. State Key Laboratory of ASIC & System, Department of Microelectronics, Fudan University, Shanghai 201203, China;SNDL, ECE Department, National University of Singapore, Singapore 117576, Singapore |
| Abstract: | time, tn, is observed in the diffusion limited region of the RD model. |
| Keywords: | reaction-diffusion model interface-trap generation/passivation negative bias temperature instability charge pumping direct-current current-voltage |
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