A charge allocating model for the breakdown voltage calculation and optimization of the lateral RESURF devices |
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Authors: | Li Xiaogang Feng Zhicheng Zhang Zhengyuan Hu Mingyu |
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Affiliation: | 1. No. 24 Research Institute of China Electronics Technology Group Corporation, Chongqing 400060, China 2. No. 24 Research Institute of China Electronics Technology Group Corporation, Chongqing 400060, China;National Laboratory of Analog IC, Chongqing 400060, China |
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Abstract: | A new quite simple analytical model based on the charge allocating approach has been proposed to describe the breakdown property of the RESURF (reduced surface field) structure. It agrees well with the results of numerical simulation on predicting the breakdown voltage. Compared with the latest published analytical model, this model has a better accuracy according to the numerical simulation with simpler form. The optimal doping concentration (per unit area) of the epi-layer of the RESURF structures with different structure parameters has been calculated based on this model and the results show no significant discrepancy to the data gained by others. Additionally the physical mechanism of how the surface field is reduced is clearly illustrated by this model. |
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Keywords: | RESURF devices analytical model breakdown voltage device optimization |
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