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InP-base resonant tunneling diodes
Authors:Han Chunlin  Chen Chen  Zou Penghui  Zhang Yang  Zeng Yiping  Xue Fangshi  Gao Jianfeng  Zhang Zheng  Geng Tao
Affiliation:1. State Key Laboratory of Monolithic Integrated Circuits and Modules,Nanjing Electronic Devices Institute,Nanjing 210016,China
2. Institute of Semiconductors,Chinese Academy of Sciences,Beijing 10083,China
Abstract:We have fabricated Ino.53Ga0.47As/AlAs/InP resonant tunneling diodes (RTDs) based on the air-bridge technology by using electron beam lithography processing. The epitaxial layers of the RTD were grown on semiinsulating (100) InP substrates by molecular beam epitaxy. RTDs with a peak current density of 24.6 kA/cm2 and a peak-to-valley current ratio of 8.6 at room temperature have been demonstrated.
Keywords:RTD  electron beam lithography  air-bridge
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