Reliability of asic devices |
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Authors: | R. P. Thornton |
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Affiliation: | Telecom Research Laboratories, 770 , Blackburn Rd., Clayton, 3168, Australia |
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Abstract: | Abstract The use of application-specific integrated circuits (ASICs) has become widespread; from use in sophisticated telecommunications equipment through to children's toys. However, aspects of design, fabrication and testing may not be as rigorous as for the standard components that they are replacing. ASICs by their nature are usually low volume components and tend to be fabricated using the latest technology. However, the additional substantial costs involved with comprehensive reliability and quality assessment mean that testing is often less exhaustive, resulting in a product of uncertain reliability. Conventional wisdom states that fewer components will mean greater reliability; however if the devices are replaced by one of uncertain reliability, this will not necessarily be the case. This paper presents some considerations that should to be taken into account when contemplating the use of ASICs in place of conventional components. These are highlighted with specific examples seen at Telecom Australia Research Laboratories (TRL). |
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Keywords: | keywords: PZT fatigue refresh |
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