Quantitative Measurement of Dielectric Properties Using Scanning Nonlinear Dielectric Microscopy with Electro-Conductive Cantilever |
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| Authors: | Koya Ohara Yasuo Cho |
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| Affiliation: | Research Institute of Electrical Communication , Tohoku University , 2-1-1 Katahira, Aoba-ku, Sendai , 980-8577 , Japan |
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| Abstract: | A quantitative measurement method of the linear and nonlinear dielectric constant using cantilever-type scanning nonlinear dielectric microscopy (SNDM) is reported. Using this method, we succeed in quantitatively measuring the linear dielectric constant distribution of TiO 2 -Bi 2 Ti 4 O 11 ceramics and nonlinear dielectric constant of LiTaO 3 single crystal. |
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| Keywords: | Scanning Nonlinear Dielectric Microscopy Quantitative Measurement Linear Dielectric Constant Nonlinear Dielectric Constant |
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