Effects of temperature on the ferroelectric properties of PbZr0.53Ti0.53O3-based capacitors prepared by pulsed laser-ablation deposition |
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| Authors: | R Dat O Auciello A I Kingon |
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| Affiliation: | 1. Department of Materials Science and Engineering , North Carolina State University , Raleigh , NC , 27695-7919 , USA;2. MCNC, Electronics Technologies Division , Research Triangle Park, NC , 27709-2889 , USA |
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| Abstract: | Abstract The effects of elevated temperature on the long and short term ferroelectric properties of La0.5Sr0.5Co3(LSCO)/PbZr0.53 Ti0.47O3(PZT)/La0.5Co3(LSCO) heterostructure capacitors are presented in this paper. Capacitors are evaluated in the temperature range of 25°C to 100°C. Polarization values (switched and non-switched), coercive voltages, and PZT resistivity are measured as a function of temperature. Rate of fatigue, tendency to imprint, and retention loss are also investigated in the 25–100°C temperature range. An activation energy for the process responsible for loss of remanent polarization is determined from the fatigue data. |
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| Keywords: | Ferroelectric memory lead zirconate titanate fatigue imprint retention |
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