| 用一个初始状态生成伪穷尽测试集 |
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| 引用本文： | 邵建华,童家榕,唐璞山.用一个初始状态生成伪穷尽测试集[J].微电子学与计算机,1995(4). |
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| 作者姓名： | 邵建华 童家榕 唐璞山 |
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| 作者单位： | 复旦大学电子工程系ＣＡＤ室 |
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| 摘 要： | 本文给出了一种适合于级敏扫描方法（ＬＳＳＤ）的伪穷尽测试集生成方法。通过测试码生成电路中增加状态跳变控制电路，使得只需要一个初始状态就可生成整个伪穷尽测试集。由于这个特点，消除了必须在ＲＯＭ中存储多个初始状态的要求，从而简化了测试控制电路及测试过程。
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| 关 键 词： | 集成电路测试，内建自测试，测试码生成 |
Generating the Pseudoexhaustive Testing Set With One Initial State |
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| Shao Jianhua, Tong Jiarong, and Tang Pushan.Generating the Pseudoexhaustive Testing Set With One Initial State[J].Microelectronics & Computer,1995(4). |
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| Authors: | Shao Jianhua Tong Jiarong and Tang Pushan |
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| Abstract: | We proposed an approach to generate the pseudoexhaustive testing set, which is suitable to the LevelSensitive Scan Design (LSSD) environment. By addinga jumping controller into the test generator, only oneinitial state is needed to generate the whole testingset. For this reason, there is no need to store severalinitial states in ROM again, thus simplifying the sestcontrol circuit and test procedure. An example is presented to illustrate' this approach. |
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| Keywords: | Integrated circuit testing Built-inSelf-test Test generation |
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