Structural anomaly and electrical relaxation in (Na2/3Pb1/3)(Mn1/2Nb1/2)O3 ceramics

The X-ray diffraction patterns of (Na_2/3Pb_1/3)(Mn_1/2Nb_1/2)O₃ ceramics were measured within 15–850 K temperature range. The anomaly in the thermal expansion temperature dependence occurred in 250–365 K range. The generalised Cole–Cole model was proposed to describe the measured effective electric permittivity influenced by high electric conduction and the coexistence of two contributions ?*(T,f) = ?*_lattice + ?*_carriers was considered. The analysis of the electric permittivity and conduction exhibited two relaxation processes. The electric conduction relaxation characteristic time values indicated the small polaron mechanism with τ₀ ≈ 10⁻¹³ s occurring in 240–345 K range and the ionic mechanism with τ₀ ≈ 10⁻¹¹ s involved in the other relaxation occurring in the 320–510 K range. The ionic relaxation process was ascribed to a subsystem of defects, which was weakly interrelated to the anomaly in thermal expansion of the (Na_2/3Pb_1/3)(Mn_1/2Nb_1/2)O₃ ceramics. The Gate model was proposed to describe the ionic relaxation mechanism.