| IBIS-S测量系统及精度分析 |
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| 引用本文： | 占朝彬,胡玉梅,王涛. IBIS-S测量系统及精度分析[J]. 城市勘测, 2015, 0(2): 119-121. DOI: 10.3969/j.issn.1672-8262.2015.02.037 |
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| 作者姓名： | 占朝彬 胡玉梅 王涛 |
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| 作者单位： | 1. 成都市勘察测绘研究院,四川 成都,610081;2. 武汉大学测绘学院,湖北 武汉,430079 |
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| 摘 要： | 微波干涉测量技术逐渐成为对大型建筑物进行"非接触式"监测的重要手段之一。本文以IBIS-S系统为例,介绍了微波干涉测量的关键技术,并对系统的精度进行了测试。测试结果表明:该系统的测量精度能够达到亚毫米级,能够实现高精度的微变形监测。
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| 关 键 词： | IBIS-S 干涉测量 精度分析 |
IBIS-S Measurement System and Its Accuracy Analysis |
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| Zhan Chaobin,Hu Yumei,Wang Tao. IBIS-S Measurement System and Its Accuracy Analysis[J]. Urban Geotechnical Investigation & Surveying, 2015, 0(2): 119-121. DOI: 10.3969/j.issn.1672-8262.2015.02.037 |
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| Authors: | Zhan Chaobin Hu Yumei Wang Tao |
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| Abstract: | Microwave interferometry technique is becoming the method of“non-contact”monitoring for large build-ings. In this paper,we use IBIS-S system as an example,introduce the key technology of microwave interferometry and test the accuracy of the system. The result shows that the accuracy of the system can achieve sub-millimeter level and can be used for high-precision micro deformation monitoring. |
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| Keywords: | IBIS-S interference measuring accuracy analysis |
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