延迟膜光谱分析测试系统及应用

摘要: 本文介绍了一个可以测试延迟膜不同波长下的延迟量的方法。其在测量晶体相位延迟量1/4波片法的基础上，用分光光度计代替其中的光源，滤色片，以及光电探测器，并且对样品进行了测试，利用所得数据，对样品的延迟量进行光谱分析。根据其测试原理，光强的波动以及与光强有关的误差在此系统中可以忽略，且1/4波片对多波长测试的误差很小，故此测试系统有很高的精度和可靠性，可以测试其精度范围内的任意小延迟量。

The application for the system to characterize the retardation films at different wavelength

Abstract: The paper reported a method to characterize the retardance of retardation films at different wavelength. The system is based on the method of rotation of quarter wave-plate. A spectrometer was sued as the light source ,color filters and a photodetector. We measured some samples using the system, analysed the measurement data, and obtained the spectrum characteristic of the retardation films. According to the theory of the system, the variation of the light source and other errors related to light intensity are not so critical for the measurement in this system. Furthermore, some quarter wave-plate’s affect for the other wavelength is very little, so the retardance is determined in a high accuracy and in a high repeatability. In principle, any retardance within the system accuracy can be measured.