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Rapid and Nondestructive Identification of Polytypism and Stacking Sequences in Few‐Layer Molybdenum Diselenide by Raman Spectroscopy
Authors:Xin Lu  M Iqbal Bakti Utama  Junhao Lin  Xin Luo  Yanyuan Zhao  Jun Zhang  Sokrates T Pantelides  Wu Zhou  Su Ying Quek  Qihua Xiong
Affiliation:1. Division of Physics and Applied Physics, School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore, Singapore;2. Department of Physics and Astronomy, Vanderbilt University, Nashville, TN, USA;3. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA;4. Department of Physics, Centre for Advanced 2D Materials and Graphene Research Centre, National University of Singapore, Singapore, Singapore;5. Institute of High Performance Computing, Singapore, Singapore;6. NOVITAS, Nanoelectronics Centre of Excellence, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore, Singapore
Abstract:
Keywords:few layer MoSe2  interlayer shear mode  molybdenum diselenide  polytypism  stacking
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