| 利用迹线测量晶体材料中特征面取向的EBSD方法 |
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| 引用本文： | 谢季佳,徐娟,洪友士.利用迹线测量晶体材料中特征面取向的EBSD方法[J].电子显微学报,2008,27(4). |
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| 作者姓名： | 谢季佳 徐娟 洪友士 |
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| 作者单位： | 1. 中国科学院力学研究所非线性力学国家重点实验室,北京,100190
2. 河北工业大学材料学院,天津,300130 |
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| 摘 要： | 本工作研究了从单一投影面测量块体晶体材料内部特征面的EBSD方法.首先对样品表面进行SEM观察并采集图像,利用图像分析软件测量各迹线在样品台坐标系的取向.然后进行EBSD扫描获得迹线两侧各晶粒对应的取向,进一步利用坐标变换关系计算出晶粒内部的特征面迹线在晶格坐标中的方向指数.最后将全部测量的迹线的极点标示到反极图中,并与各低指数晶面的大圆位置进行对比,重合度最高的晶面就是特征面最可能的晶体学取向面.
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| 关 键 词： | 迹线 晶体取向 电子背散射衍射 反极图 |
EBSD method for identifying the crystalline orientation of special planes by measurement of traces on surface |
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| XIE Ji-jia,XU Juan,HONG You-shi.EBSD method for identifying the crystalline orientation of special planes by measurement of traces on surface[J].Journal of Chinese Electron Microscopy Society,2008,27(4). |
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| Authors: | XIE Ji-jia XU Juan HONG You-shi |
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| Affiliation: | XIE Ji-jia~1,XU Juan~2,HONG You-shi~1(1.State key laboratory of nonlinear mechanics,institute of mechanics,Chinese Academy of Sciences,Beijing 100190,2.School of Material Science , Engineering,Hebei University of Technology,Tianjin 300130,China) |
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| Abstract: | This paper investigated the EBSD method for identifying the crystalline orientation of inner special planes in bulk sample from only one projection of the sample.Firstly,the sample surface with traces of special planes was observed.The orientations of the traces in the stage coordinates were acquired by using image measurement.Then,the EBSD analysis was carried out on sample surface to identify the orientations of grains with traces.According the coordinates transformation between the stage coordinates and ... |
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| Keywords: | trace crystalline orientation EBSD inverse pole figure |
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