| 扫描电镜在织物、纱线色差分析中的应用 |
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| 引用本文： | 高仪祥. 扫描电镜在织物、纱线色差分析中的应用[J]. 合成技术及应用, 2011, 26(2): 56-60 |
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| 作者姓名： | 高仪祥 |
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| 作者单位： | 中国石化仪征化纤股份有限公司技术中心,江苏仪征,211900 |
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| 摘 要： | 介绍了一种使用扫描电子显微镜分析织物色差原因的方法,通过对织物结构、纱线质量进行形貌分析,发现织物密度、纱线质量以及并丝、僵丝、断头、未牵伸丝等纤维疵点是织物产生色差的原因。结果表明,该方法具有快速、便捷、准确的优点,可以完全满足生产、营销的技术需要。
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| 关 键 词： | 扫描电镜 色差 织物 纱线 纤维 |
Application of scanning electron microscope in the analysis of fabric and yarn with color defect |
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| Gao Yixiang. Application of scanning electron microscope in the analysis of fabric and yarn with color defect[J]. Synthetic Technology and Application, 2011, 26(2): 56-60 |
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| Authors: | Gao Yixiang |
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| Affiliation: | Gao Yixiang (Sinopec Technical Center of Yizheng Chemical Fiber Co.Ltd.,Yizheng Jiangsu 21 1900,China) |
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| Abstract: | This paper discussed a new method for analyzing the cause of fabric and yarn with color defect by scanning electron microscope.We found that the numerous cause of color defect on fabric were fabric structure density and the quality of yarn and fiber by analyzing fabric and yarn texture.This method had the advantage of fast and accurate and it could fully satisfy the need of manufacture and distribution. |
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| Keywords: | Scanning Electron Microscope(SEM) color defect fabric yarn fiber |
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