| Abstract: | We discuss the method for measuring surface charge density accumulated on the surface of a solid dielectric (insulating specimen) such as a supporting spacer in gas and vacuum insulated equipment. For such thick specimens, the probe response does not correspond to the charge density directly below the probe, so the measurement necessitates multipoint data together with the aid of numerical field calculations. The probe gives either induced charge or floating potential in response to the surface charge. We compare various previously proposed techniques and give a reasonable procedure for analyzing the data |
