首页 | 本学科首页   官方微博 | 高级检索  
     


Comparison of different flex materials in high density flip chip on flex applications
Authors:Petteri Palm  Jarmo Mttnen  Yannick De Maquill  Alain Picault  Jan Vanfleteren  Bjrn Vandecasteele
Affiliation:a Imbera Electronics Oy, Tekniikantie 14, P.O. Box 74, FIN-02151, Espoo, Finland;b Elcoteq Network Corporation, Sinimäentie 8b, P.O. Box 8, FIN-02631, Espoo, Finland;c FCI Microelectronics, 37, rue des Closeaux, 78200, Mantes la Jolie, France;d IMEC, Intec division, Thin Film Components Group (TFCG), St.-Pietersnieuwstraat 41, B-9000, Gent, Belgium
Abstract:This paper presents the results from the evaluation of different types of flexible substrates for high-density flip chip application. In this work four different flexible substrates were used. The flex substrates were Espanex, Upilex and epoxy glass with 80 μm pitch and Upilex with 54 μm pitch. Two different test IC’s were used for both pitches. In test IC1 (80 μm pitch) and IC3 (54 μm pitch) the bumps were in one row and test IC2 (80 μm pitch) and IC4 (54 μm pitch) in two rows. The total amount of contacts in test IC1 was 190, in test IC2 173, in test IC3 293 and in test IC4 270. The anisotropically conductive adhesive that was used in the tests was epoxy based thermosetting adhesive film with conductive particles. The conductive particles in the adhesives were isolated soft metal-coated polymer particles. The contact resistance was measured using Kelvin four-point method and the continuity and series resistance using daisy chain structure. The reliability of the flip chip interconnections was tested in temperature cycling test and environmental test. Cross section samples were made to analyse the possible reason for failures. The results presented in this paper are from FLEXIL development project that is part of European Union IST research program.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号