| 用于材料样品的电镜超薄切片辅助定位装置 |
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| 引用本文： | 朱燕华,王戈,刘彬鑫,郭新秋,何琳. 用于材料样品的电镜超薄切片辅助定位装置[J]. 电子显微学报, 2019, 38(2): 171-174 |
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| 作者姓名： | 朱燕华 王戈 刘彬鑫 郭新秋 何琳 |
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| 作者单位： | 上海交通大学分析测试中心,上海,200240;上海交通大学分析测试中心,上海,200240;上海交通大学分析测试中心,上海,200240;上海交通大学分析测试中心,上海,200240;上海交通大学分析测试中心,上海,200240 |
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| 基金项目： | 上海交通大学实验室创新研究课题资助项目 |
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| 摘 要： | 切片定位是超薄切片技术中的难点。随着材料、化学等学科的不断发展,材料类样品的超薄切片定位需求日益增多,而现有材料样品的超薄切片定位技术操作繁琐,定位工作效率较低。本文介绍了一套面向材料类样品的超薄切片辅助定位装置,可实时原位观察、采集包埋块中的样品侧切面图像,并通过Image View图像处理工具精确测量样品切面的定位偏离角度,可大幅缩短切片定位所需的时间。该超薄切片辅助定位装置通用性强、操作简便,可大幅提高材料类样品的超薄切片定位效率并促进超薄切片技术的可视化实验教学。
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| 关 键 词： | 超薄切片 辅助定位 偏离角度 可视化 |
Auxiliary location equipment of TEM ultrathin section for material specimen |
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| ZHU Yan-hua,WANG Ge,LIU Bin-xin,GUO Xin-Qiu,HE Lin. Auxiliary location equipment of TEM ultrathin section for material specimen[J]. Journal of Chinese Electron Microscopy Society, 2019, 38(2): 171-174 |
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| Authors: | ZHU Yan-hua WANG Ge LIU Bin-xin GUO Xin-Qiu HE Lin |
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| Affiliation: | (Instrumental Analysis Center,Shanghai Jiao Tong University,Shanghai 200240,China) |
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| Abstract: | The location of sample is a difficulty in ultrathin section. With the development of materials,chemistry and other fields,the requirements for sample location during ultrathin section increase. An auxiliary location equipment of ultrathin section for material specimen is developed. This equipment can acquire the real-time images of in-situ sample side-section in the embedding block. It can measure section deviation angle accurately by ImageView software. The time required for location can be greatly shortened. This equipment has good universality and easy to operate. It can greatly improve the efficiency of ultrathin section location of material samples and promote the visual experiment teaching of ultra-thin slices technology. |
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| Keywords: | ultrathin section auxiliary location angle deviation visualized |
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