嵌入式存储器MBIST设计中内建自诊断功能研究

针对大规模嵌入式存储器可测性设计技术——存储器内建自测试（MBIST）中的故障诊断问题，介绍了MBIST设计的扩展功能——存储器内建自诊断（MBISD）。在引入存储器内建自测试的基础上，详细分析了存储器内建自诊断模块根据输出故障信息自动分析器件失效原因、并对失效单元进行故障定位和识别的基本原理及其中的关键算法，并用一块SRAM的MBIST设计（采用Mentor公司的MBISTArchitect完成）中的MBISD具体实例进行了仿真验证。存储器内建自诊断的应用，大大提高了存储器的成品率。

Study of Memory Build-In Self Diagnosis in MBIST for Embedded Memories

Memory Build-In Self Diagnosis (MBISD) in Memory Build-In Self Test (MBIST) technology is introduced, which is widely used in the design of testability of embedded memories. And the principle and pivotal arithmetic of MBISD are explained. With the output faults information of MBIST, MBISD modules analyze the causes of physical faults in chips, and also identify and pinpoint the faults automatically. The application of the MBISD increases the memories' yield dramatically. In addition, an application design for a piece of SRAM, the MBIST circuit of which is produced by MBISTArchitect of Mentor, is used to validate the correctness and accuracy in faults identification and orientation of MBISD modules in MBIST.