|
|||||
|
|
A Statistical Physics Method of Electronic Device Reliability Testing from Working Data |
|
| Authors: | S. Ya. Grodzenskii |
| Affiliation: | (1) 5401 Katherine Avenue, 91401-4922 Sherman Oaks, Los Angeles, CA, USA;(2) Department of Statistics, Rajshahi University, Rajshahi, Bangladesh;(3) School of Mechanical and Mining Engineering, The University of Queensland, Brisbane, QLD, 4072, Australia |
| Abstract: | A combined method is used to estimate the parameters for a mixture of exponential and Weibull distributions. Examples are given of the method applied in reliability analysis for high-power electronic devices. |
| Keywords: | reliability working life Weibull and exponential distributions distribution mixture electronic device |
| 本文献已被 SpringerLink 等数据库收录！ | |