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纳米电子器件及其集成
引用本文:刘明,陈宝钦,谢常青,王丛舜,龙世兵,徐秋霞,李志钢,易里成荣,涂德钰,商立伟.纳米电子器件及其集成[J].半导体学报,2006,27(13):7-10.
作者姓名:刘明  陈宝钦  谢常青  王丛舜  龙世兵  徐秋霞  李志钢  易里成荣  涂德钰  商立伟
作者单位:中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029;中国科学院微电子研究所 纳米加工与新器件集成实验室,北京 100029
摘    要:对基于Top-Down加工技术的纳米电子器件如:单电子器件、共振器件、分子电子器件等的研究现状、面临的主要挑战等进行了讨论. 采用CMOS兼容的工艺成功地研制出单电子器件,观察到明显的库仑阻塞效应;在半绝缘GaAs衬底上制作了AlAs/GaAs/In0.1Ga0.9As/GaAs/AlAs双势垒共振隧穿二极管,采用环型集电极和薄势垒结构研制的共振隧穿器件,在室温下测得其峰谷电流比高达13.98,峰电流密度大于89kA/cm2;概述了交叉阵列的分子存储器的研究进展.

关 键 词:自上而下的纳米加工  纳米器件  单电子器件  共振器件

Nano Electrical Devices and Integration
Liu Ming,Chen Baoqin,Xie Changqing,Wang Congshun,Long Shibing,Xu Qiuxi,Li Zhigang,Yili Chengrong,Tu Deyu and Shang Liwei.Nano Electrical Devices and Integration[J].Chinese Journal of Semiconductors,2006,27(13):7-10.
Authors:Liu Ming  Chen Baoqin  Xie Changqing  Wang Congshun  Long Shibing  Xu Qiuxi  Li Zhigang  Yili Chengrong  Tu Deyu and Shang Liwei
Affiliation:Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China;Key Laboratory of Nano-Process and New Type of Devices Integrated Technology,Institute of Microelectronics, Chinese Academy of Sciences,Beijing 100029, China
Abstract:The progress and challenge on quantum mechanism nano-devices such as single-electron transistors (SET),resonant tuneling diodes(RTD), and molecular devices are investigated and discussed.The SET with CMOS compatible technology is successfully fabricated,and the Coulomb blockade effect is clearly observed.AlAs/GaAs/In0.1Ga0.9As/GaAs/AlAs double-barrier resonant tunneling diodes (DBRTDs) grown on semi-insulated GaAs substrate with molecular beam epitaxy are demonstrated.With ringed collector and thin barriers,the devices exhibit a maximum PVCR of 13.98 and a peak current density of 89kA/cm2 at room temperature.Finally,the progress of molecular memory with cross-bar structure is summarized.
Keywords:top-down fabrication  nano-device  single electron device  resonant tunneling device
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