| CMOS电路开关级测试生成的一种新算法 |
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| 引用本文： | 胡江红,胡谋.CMOS电路开关级测试生成的一种新算法[J].计算机学报,1993,16(6):416-423. |
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| 作者姓名： | 胡江红 胡谋 |
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| 作者单位： | 上海铁道学院可靠计算系统研究室，上海铁道学院可靠计算系统研究室 上海 200333，上海 200333 |
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| 摘 要： | 本文提出了一种新的CMOS电路开关级测试生成算法,该算法以Hayes模型为基础,以开关级代数为工具,充分利用CMOS电路自身的特点,生成CMOS电路的完全测试集,这种算法较之于已有的算法简单而有效,检测CMOS电路的常开型故障需一对测试码,本文给出了一种简单的求一对稳健测试码的方法,基于这种算法,我们开发了一个测试自动生成软件。
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| 关 键 词： | 测试 CMOS电路 开关级 算法 |
A NEW ALGORITHM FOR SWITCH-LEVEL TEST GENERATION OF CMOS CIRCUITS |
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| Hu Jianghong and Hu MouReliable Computing Research Group.A NEW ALGORITHM FOR SWITCH-LEVEL TEST GENERATION OF CMOS CIRCUITS[J].Chinese Journal of Computers,1993,16(6):416-423. |
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| Authors: | Hu Jianghong and Hu MouReliable Computing Research Group |
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| Affiliation: | Hu Jianghong and Hu MouReliable Computing Research Group,Shanghai Institute of Railway Technology,Shanghai 200333 |
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| Abstract: | A new algorithm for switch-level test generation of CMOS circuits is proposed in this paper.The algorithm is based on the Hayes model and switch-level algebra.It takes advantages of CMOS circuit features,and can generate a complete test set for a given CMOS circuit.The proposed algorithm is simpler and more efficient than existing algorithms.A simple method is given in this paper to generate a pair of robust tests to test stuck-open faults.A test generation software package is developed based on this algorithm. |
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| Keywords: | Test generation CMOS circuit switch-level technique stuck-open fault stuck-closed fault |
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