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Sn2P2S6 films for memory devices with nondestructive readout
Authors:Elena Arnautova  Eugene Sviridov  Eugene Rogach  Esther Savchenko  Anatoly Grekov
Affiliation:Rostov-on-Don State University, Pedagogical Institute , Rostov-on-Don, Russia
Abstract:The polarization switching processes of ferroelectric polycrystalline Sn2P2S6 films on Al substrates were studied. The effect of full reverse spontaneous switching after the influence of a repolarizing pulse on the prepoled sample was investigated. This opens the way for making the ferroelectric memory devices with rapid nondestructive readout.
Keywords:PZT film  Zr/Zr+Ti ratio  MOCVD  RTA  MPB
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