Microstructures and thermochromic properties of tungsten doped vanadium oxide film prepared by using VOX-W-VOX sandwich structure

Tungsten doped vanadium oxide (VO_X) thin films were prepared by oxygen annealing VO_X-W-VO_X sandwich layers. X-ray photoelectron spectroscopy, X-ray diffraction and field emission scanning electron microscope were employed to characterize the compositions, crystal structures and surface morphologies, respectively. It was demonstrated that sandwich structure suppressed the crystallization of VO_X, and that V⁵⁺ was reduced by diffused W atom to V⁴⁺. The results of surface morphologies indicated that the grain arrangement of W doped vanadium dioxide film exhibited some regular patterns compared with the random grain distribution of undoped film. Electrical measurements showed that the square resistance of V₂O₅ film and semiconductor-metal transition temperature of VO₂-V₂O₅ film decreased obviously after W doping. In addition, thermal hysteresis loop was observed in W doped V₂O₅ film with thick W middle layer. The investigation of optical properties indicated that the optical band gap of W doped V₂O₅ film decreased with the increase of thickness of W middle layer, and the optical switching performance in the near-infrared range of VO₂-V₂O₅ slightly weakened after W doping.