| 某引信电路的可靠性预计和贮存寿命分析 |
| |
| 引用本文： | 李长福,夏建中,杨毅. 某引信电路的可靠性预计和贮存寿命分析[J]. 探测与控制学报, 1999, 21(3): 30-34 |
| |
| 作者姓名： | 李长福 夏建中 杨毅 |
| |
| 作者单位： | 1. 北京2418信箱28分箱,北京,100089
2. 西安121信箱,陕西,西安,710065 |
| |
| 摘 要： | 利用ＧＪＢ／Ｚ２９９Ａ和ＧＪＢ／Ｚ１０８分别对某无线电引信的分立元器件电路和集成电路的作用可靠性进行了预计，并对电路的贮存寿命进行了预计和对比分析。
|
| 关 键 词： | 引信电路 电路 可靠性预计 贮存寿命 |
| 修稿时间： | 1999-02-09 |
The Reliability Prediction of Radio Fuze Circuits and their Storage life Analysis |
| |
| LI Chang-fu,XIA Jian-zhong,YANG Yi. The Reliability Prediction of Radio Fuze Circuits and their Storage life Analysis[J]. Journal of Detection & Control, 1999, 21(3): 30-34 |
| |
| Authors: | LI Chang-fu XIA Jian-zhong YANG Yi |
| |
| Abstract: | In this paper, the operating reliabilities of the discrete device circuit and integrated circuit of a radio fuze are predicted by using GJB/Z and GJB/Z108, respectively. Finally, the storage lives of the circuits are analyzed with the help of a comparision method. |
| |
| Keywords: | fuze circuit reliability life |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ |
|
