|
|||||
|
|
Invariant pattern recognition using radon, dual-tree complex wavelet and Fourier transforms |
|
| Authors: | G.Y. Chen [Author Vitae] T.D. Bui [Author Vitae] [Author Vitae] |
| Affiliation: | Department of Computer Science and Software Engineering, Concordia University, Montreal, Quebec, Canada H3G 1M8 |
| Abstract: | |
| Keywords: | Radon transform Wavelet transform Dual-tree complex wavelet transform Fourier transform Feature extraction Pattern recognition |
| 本文献已被 ScienceDirect 等数据库收录！ | |