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交流磁控溅射制备ZAO薄膜工艺参数的研究
引用本文:李士元,付恩刚,庄大明,张弓.交流磁控溅射制备ZAO薄膜工艺参数的研究[J].材料科学与工艺,2005,13(6):643-646.
作者姓名:李士元  付恩刚  庄大明  张弓
作者单位:中兴通讯股份有限公司,深圳,518000;清华大学,机械工程系,北京,100084;Dept.of Physics,The University of Hong Kong,Hong Kong;清华大学,机械工程系,北京,100084
摘    要:对于交流磁控溅射氧化锌铝陶瓷靶材制备ZAO薄膜,研究了氧流量、基体温度、靶电流密度、铝的掺杂量、本底真空压力和工作气体压力对ZAO薄膜电学性能的影响规律,优化了工艺参数,为工业化生产提供了实验依据.

关 键 词:磁控溅射  ZAO薄膜  工艺参数  电阻率
文章编号:1005-0299(2005)06-0643-04
收稿时间:2004-01-14
修稿时间:2004年1月14日

Study on deposition parameters of ZAO films by AC magnetron sputtering
LI Shi-yuan,FU En-gang,ZHUANG Da-ming,ZHANG Gong.Study on deposition parameters of ZAO films by AC magnetron sputtering[J].Materials Science and Technology,2005,13(6):643-646.
Authors:LI Shi-yuan  FU En-gang  ZHUANG Da-ming  ZHANG Gong
Affiliation:1. ZTE Corporation, Shenzhen, 518057; 2. Dept. of Mechanical Engineering, Tsinghua University, Beijing, 100084; 3. Dept. of Physics, The University of Hong Kong, Hong Kong
Abstract:The deposition parameters of ZAO thin films prepared by middle - frequency alternative magnetron sputtering with ZAO ceramic target were specifically analyzed and the effects of oxygen flux, substrate temperature, current density, Al concentration, base vacuum pressure and argon gas pressure on the electrical proper- ty of ZAO thin films were discussed. The optimum parameters for depositing ZAO thin films with low resistivity were obtained, which can provide practical and theoretical bases for its industrial production.
Keywords:Magnetron sputtering  ZAO thin film  deposition parameter  resistivity
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