| 双酚A型聚砜X射线致发降解的X射线光电子能谱研究 |
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| 引用本文： | 冀克俭,张银生.双酚A型聚砜X射线致发降解的X射线光电子能谱研究[J].辐射研究与辐射工艺学报,1992,10(3):187-189. |
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| 作者姓名： | 冀克俭 张银生 |
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| 作者单位： | 山东非金属材料研究所 济南
(冀克俭)，山东非金属材料研究所 济南(张银生) |
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| 摘 要： | 利用X射线光电子能谱(XPS)研究了双酚A型聚砜薄膜在超高真空下X射线辐照所引起的表面化学组成变化。结果表明:(1)聚砜在X射线辐照下,部分砜基团变成了硫化物。(2)硫化物的生成量取决于辐照时间。(3)在XPS的取样深度里,同一辐照时间下,X射线致发降解的程度基本上是均匀的。
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| 关 键 词： | X射线 聚砜 辐照 降解 XPS |
X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON X-RAY INDUCED DEGRADATION OF BISPHENOL A POLYSULPHONE FILMS |
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| Ji Kejian,Zhang Yinsheng Shandong Non-metallic Material Research Institute,Jinan.X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON X-RAY INDUCED DEGRADATION OF BISPHENOL A POLYSULPHONE FILMS[J].Journal of Radiation Research and Radiation Processing,1992,10(3):187-189. |
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| Authors: | Ji Kejian Zhang Yinsheng Shandong Non-metallic Material Research Institute Jinan |
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| Abstract: | The changes of surface composition of bisphenol A polysulphonefilms induced by X ray in ultrahigh vacuum have been studied using X ray photoe-lectron spectroscopy (XPS). The results show: (1) The sulphone group is partiallychanged into sulphide. (2) The extent of sulphide formation is dependent on irradiationtime. (3) The degree of X ray induced degradation is basically uniform at thesame irradiation time within the sampling depth. |
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| Keywords: | X ray photoelectron spectroscopy Polysulphone X-rayradiation Degradation |
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