Dielectric properties of Fe(OH)3 thin films formed at solution-gas interface |
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Authors: | P S Nikam K A Pathan |
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Affiliation: | (1) P G Department of Physical Chemistry, M S G College, 423 105 Malegaon Camp, India;(2) Department of Physics, M S G College, 423 105 Malegaon Camp, India |
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Abstract: | Dielectric properties of solution-gas interface-formed Fe(OH)3 thin-film capacitors (Al/Fe(OH)3/Al) of various thicknesses have been studied in the frequency range 10–106 Hz at various temperatures (300–443 K). Dielectric constant, ε, increases with increasing film thickness (d) and temperature (T) and decreases with increase of frequency (f). The loss factor (tan δ), showing pronounced minimum with frequency, increases with rise of temperature, and tan δmin shifts to a higher frequency. The large increase in dielectric constant towards low frequency region indicates the possibility
of an interfacial polarization mechanism in this region. |
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Keywords: | Capacitance dielectric constant loss factor interfacial polarization microscopic field distortion |
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