Optical and electrical properties of carbon nitride films deposited by cathode electrodeposition |
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Authors: | Jia-Tao Zhang Chuan-Bao Cao Qiang Lv Chao Li He-Sun Zhu |
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Affiliation: | (1) Research Center of Materials Science, Beijing Institute of Technology, P.O. Box 327, Beijing, 100081, People's Republic of China |
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Abstract: | Carbon nitride (CN
x
) films were prepared on silicon (100) wafers and ITO conductive glasses by cathode electrodeposition, using dicyandiamide (C2H4N4) in acetone as precursors. The composition ratios (N/C) were approximated to or larger than 1 from XPS. The optical properties and electrical resistivities of the films were investigated. Intense PL with two bands in the range 2.5–3.5 eV was observed on the CN
x
films. The band gaps (E
opt) deduced from measurements of the optical absorption coefficients in the UV-VIS spectra were found to be in the range of 1.1–1.6 eV. From the PL and UV-VIS spectra, the nitrogen content has a large effect on the PL band gap and E
opt. The electrical resistivities of the films on Si wafers are in the 109–1010 · cm range. |
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Keywords: | |
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