Reliability Analysis of Logic Circuits |
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Authors: | DesMarais P. Krieger M. |
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Affiliation: | Dept. of Electrical Engineering/University of Ottawa/Ottawa, Ontario K1N 6N5 CANADA; |
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Abstract: | An efficient algorithm is presented for computing the reliability matrix of a logic network whose components are characterized by a known probability of malfunctioning. Using the concept of path sensitizing, a graphical representation of error propagation is derived. Through the computation of Boolean path functions, the information provided by these graphs is put into a malfunction table from which the matrix entries are directly computed. The method not only offers computational efficiency but also provides further physical insight into the reliability problem. |
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