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直接观察位错结构的扫描电镜电子通道衬度技术
引用本文:胡运明,陈道伦,苏会和,王中光. 直接观察位错结构的扫描电镜电子通道衬度技术[J]. 材料研究学报, 1997, 11(3): 240-244
作者姓名:胡运明  陈道伦  苏会和  王中光
作者单位:中国科学院金属研究所
基金项目:国家自然科学基金!19392300-4
摘    要:介绍了扫描电镜电子通道衬度技术,该技术可以很好地观察材料中位错结构、用这种技术观察受循环载荷作用的铜单晶中的典型位错结构,与常规的TEM方法观察结果基本一致。

关 键 词:扫描电镜 电子通道衬度 铜单晶体 位错结构
收稿时间:1997-06-25
修稿时间:1997-06-25

ELECTRON CHANNELING C0NTRAST TECHNIQUE IN SCANNING ELECTR0N MICR0SC0PY APPLIED T0 0BSERVATI0N 0F DISL0CATION STRUCTURE
HU Yunming,CHEN Daolun,SU Huihe,WANG Zhongguang. ELECTRON CHANNELING C0NTRAST TECHNIQUE IN SCANNING ELECTR0N MICR0SC0PY APPLIED T0 0BSERVATI0N 0F DISL0CATION STRUCTURE[J]. Chinese Journal of Materials Research, 1997, 11(3): 240-244
Authors:HU Yunming  CHEN Daolun  SU Huihe  WANG Zhongguang
Affiliation:HU Yunming,CHEN Daolun,SU Huihe,WANG Zhongguang(State Key Laboratory for Fatigue and Fracture of Materials,Institute of Metal Research)
Abstract:The dislocation structures formed in a copper single crystal under Cyclic straining were studiedby using an electron channeling contrast (ECC) in the scanning electron microscope (SEM). It was shownthat the SEM-ECC technique can well be used to investigate dislocation structures in defGrmed metals. Thetypical dislocation structures observed in the cyclica1ly deformed copper single crystal by means of this pow-erful technique are in good agreement with those observed by transmission electron microscope (TEM).
Keywords:scanning electron microscope electron channeling contrast technique copper single crystal dislocation structure  
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