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Dose-rate dependence of electron-induced mass loss from organic specimens
Authors:R. F. Egerton  I. Rauf
Affiliation:Physics Department, Faculty of Science, 412 Avadh Bhatia Physics Laboratory, University of Alberta, Edmonton, Alberta, Canada T6G 2J1
Abstract:Electron energy-loss measurements on thin films of collodion at low temperatures (90 K) show that the characteristic electron dose De for mass loss first increases and then decreases with increasing dose rate (current density). This behaviour is explained in terms of the limited diffusion rates at low specimen temperature and the heating effect of the electron beam, and can be approximately modelled using a simple computer program. For a small-diameter electron probe, the increase in De can be several orders of magnitude, suggesting a substantial advantage of STEM (in comparison to fixed-beam TEM) for examining beam-sensitive specimens.
Keywords:Electron energy loss spectroscopy (EELS)   Radiation effects (experimental)
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