Fabrication tolerance of Ti:LiNbO3 waveguides |
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| Authors: | Chu F.S. Liu P.L. Baran J.E. |
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| Affiliation: | Dept. of Electr. & Comput. Eng., State Univ. of New York, Buffalo, NY; |
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| Abstract: | A simulation program based on the three-dimensional beam propagation method (BPM) is used to study the fabrication conditions of single-mode Ti:LiNbO3 waveguides. The calculated cutoff wavelengths are in good agreement with experimental data. The thickness of titanium needed to support the fundamental and first-order modes for three Ti strip widths (6, 7, and 8 μm) is calculated. The two-dimensional BPM is used to calculate the coupling length from the fabrication conditions. Results are consistent with measured data. The fabrication tolerances of the coupling length of directional couplers are also presented |
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