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雷达数字电路板故障测试技术研究
引用本文:王建虹.雷达数字电路板故障测试技术研究[J].国外电子测量技术,2010,29(1):53-55.
作者姓名:王建虹
作者单位:中国电子科技集团公司第38研究所,合肥,230031
摘    要:现代军用电子设备大量采用各种大规模和超大规模集成电路和电子计算机,使其本身变得日益复杂,给使用、维修和保障带来很多严重问题。在这种情况下,研究故障诊断和测试技术就显得十分重要。介绍了一种雷达数字电路板的可测试性设计方法,包括设计采取的措施、测试性工作流程、测试性的工作内容。该技术已经成功应用多种雷达数字电路板故障测试中,效果明显。

关 键 词:雷达  可测试性  可测试性技术  故障

Fault testability technology of digital circuit board for radar
Wang Jianhong.Fault testability technology of digital circuit board for radar[J].Foreign Electronic Measurement Technology,2010,29(1):53-55.
Authors:Wang Jianhong
Affiliation:Wang Jianhong (No. 38 Research Institution of CETC, Hefei 230031,China)
Abstract:Modern military affairs are becoming more and more complex for all kinds of large scale integrated and grand scale integration circuit are used. Therefore, a great many problems such as useability, maintain and indemnificatory were come to bing. In this instance, the search of the fault diagnosis and testability technology is very important. In this paper the testablity technology of digital circuit board for radar is summarized. The design principle, research content and work flow for testability, are introduced in detail. The fault testability technology has been applied in many kinds of digital circual board for radar.
Keywords:radar  testability  testability technology  fault
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