Direct sub-nanometer scale electron microscopy analysis of anion incorporation to self-ordered anodic alumina layers |
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| Authors: | L. Gonzá lez-Rovira,A.B. Hungrí a,J.M. Sá nchez-Amaya,F.J. Botana |
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| Affiliation: | a Department of Materials Science and Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, República Saharaui s/n, 11510 Puerto Real, Cádiz, Spain
b Titania, Ensayos y Proyectos Industriales, S.L. Parque Tecnobahía, Edificio RETSE, Nave 4, 11500 El Puerto de Santa María (Cádiz), Spain |
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| Abstract: | Ordered porous alumina layers prepared by two-step anodising in phosphoric, oxalic and sulphuric acids have been characterized at sub-nanometer scale using electron microscopy techniques. FEG-SEM and STEM-HAADF images allowed estimating the pore size, cell wall and pore wall thicknesses of the layers. Nanoanalytical characterization has been performed by STEM-EELS and STEM-X-EDS. Detailed features of the spatial distribution of anions in the pore wall of the films have been obtained. Maximum concentration of P-species occurs, approximately, at the middle of the pore wall; adjacent to the pore for C-species, whereas the distribution of S-species appears to be uniform. |
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| Keywords: | A. Aluminium B. SEM B. STEM C. Anodic films |
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