| 谱域光学相干层析测量技术研究 |
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| 引用本文： | 秦玉伟. 谱域光学相干层析测量技术研究[J]. 激光杂志, 2014, 0(5): 20-21 |
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| 作者姓名： | 秦玉伟 |
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| 作者单位： | 渭南师范学院物理与电气工程学院,陕西渭南714000 |
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| 基金项目： | 陕西省军民融合研究基金项目（13JMR18）;陕西省教育厅科学研究计划项目（12JK0672）;陕西省科技厅国际交流合作项目（2013KW04-03） |
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| 摘 要： | 介绍了一种基于谱域光学相干层析成像的光学测量技术,对其基本原理进行了分析,并通过平面镜位移实验对该理论进行了验证。实验结果表明,该方法测得的数值与理论值基本一致,表明谱域光学相干层析成像技术的测量结果真实可靠,可以为高散射物体的表面轮廓测量和低散射物体的内部结构成像提供技术支撑。
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| 关 键 词： | 测量与计量 光学相干层析成像 检测 |
Study on measuring technique of optical coherence tomography |
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| QIN Yu-wei. Study on measuring technique of optical coherence tomography[J]. Laser Journal, 2014, 0(5): 20-21 |
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| Authors: | QIN Yu-wei |
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| Affiliation: | QIN Yu-wei (School of Physics and Electrical Engineering, Weinan Normal University, Weinan, Shaanxi 714000, China) |
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| Abstract: | A optical measuring thehnique based on spectral-domain optical coherence tomography（OCT） was used introduced. The basic principle was analyzed and then the principle was verified by the mirror displace experiment. The experimental result shows that the measuring result was almost same as the theoretical value. It was illustrated that the measurement of the spectral-domain OCT was true and reliable. It can provide the technical support for the profile measurenment of high scattering material and the inner structure imaging of low scattering material. |
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| Keywords: | Measurement and metrology Optical coherence tomography Detection |
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