An intensity correction for pole figure measurements by grazing incident and grazing exit angle X-ray diffraction |
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| Affiliation: | 1. Science Faculty, Materials Physics Laboratory, Sfax University, 3018, Sfax, Tunisia;2. Institute for Materials Science, Darmstadt University of Technology, Petersenstr. 23, 64287, Darmstadt, Germany;1. Department of Earth Sciences, University of Florence, Via La Pira 4, 50121, Firenze, Italy;2. Department of Chemistry, University of Florence, Via Lastruccia 3-13, 50019, Sesto Fiorentino, FI, Italy;3. INSTM Florence Research Unit, Via Lastruccia 3-13, 50019, Sesto Fiorentino, FI, Italy;4. IOM-CNR, c/o European Synchrotron Radiation Facility 71, Avenue des Martyrs, 38043, Grenoble Cedex 9, France;5. Department of Engineering, University of Florence, Via di S. Marta 3, 50139, Firenze, Italy;6. ICCOM-CNR, Via Madonna del Piano 10, 50019, Sesto Fiorentino, FI, Italy;7. IGG-CNR, Via La Pira 4, 50121, Firenze, Italy;8. IPCF-CNR, Via G. Moruzzi, 1, 56124, Pisa, Italy;1. State Key Laboratory of Electronic Thin Films and Integrated Devices, School of Optoelectronic Information, University of Electronic Science and Technology of China (UESTC), Chengdu 610054, China;2. Key Laboratory of Advanced Transducers and Intelligent Control System, Ministry of Education and Shanxi Province, College of Physics and Optoelectronics, Taiyuan University of Technology, Taiyuan 030024, China;3. Key Laboratory of Interface Science and Engineering in Advanced Materials, Taiyuan University of Technology, Taiyuan 030024, China;1. Department of Electrochemistry, Faculty of Chemistry, Lomonosov Moscow State University, Leninskiye Gory, 1, Building 3, Moscow 119991, Russia;2. Faculty of Engineering, Hokkaido University, Sapporo, Hokkaido 060-8628, Japan;3. ESRF, 6 Rue Jules Horowitz, F38043 Grenoble, France;4. Skoltech Center for Electrochemical Energy Storage, Skolkovo Institute of Science and Technology, 143026, Moscow, Russia;5. Paul Scherrer Institute, 5232 Villigen PSI, Switzerland;1. Department of Nanoscale Semiconductor Engineering, Hanyang University, Seoul 133-791, South Korea;2. Department of Electronics & Computer Engineering, Hanyang University, Seoul 133-791, South Korea;1. Faculty of Materials Science and Chemistry, China University of Geosciences (Wuhan), Wuhan 430074, China;2. Department of Materials Science and Engineering, National University of Singapore, Singapore 117543, Singapore;3. Faculty of Maths and Physics, China University of Geosciences, Geosciences (Wuhan), Wuhan 430074, China |
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| Abstract: | In pole figure measurement by X-ray diffraction, the intensity must be corrected for geometric factors entering into the intensity. For the grazing (often, also called glancing) angle diffraction mode, the irradiated area changes with the grazing angle. A theoretical analysis of this effect was made and compared with measured data from a texture-free silver sample. An intensity correction factor is given as the ratio of the detector slit width and the width of the irradiated sample area as seen from the detector. As an application, the texture of thin copper film was studied. |
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