EPR characterization of defects in monoclinic powders of ZrO2 and HfO2 |
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Authors: | Sandra Wright RC Barklie |
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Affiliation: | aSchool of Physics, Trinity College, Dublin 2, Ireland |
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Abstract: | Electron paramagnetic resonance (EPR) measurements have been made on a variety of commercially available samples of the monoclinic form of the high-dielectric constant (high k) materials ZrO2 and HfO2 with the aim of characterizing the defects they contain. All EPR measurements were at about 9.5 GHz and at room temperature. An axially symmetric spectrum with g =1.961(2), g =1.976(2) is observed in most of the ZrO2 samples and a similar one with g =1.940(3), g =1.970(2) is seen for most of the HfO2 samples; they are attributed to centres involving Zr3+and Hf 3+, respectively. Their average concentration lies in the approximate range 1015–1017 cm−3, depending on the product specification, and, with one exception is unaffected by γ-irradiation. Grinding granules to powder and/or γ-irradiation yields further EPR spectra of defects, some of which are likely to involve oxygen, those are probably in the near surface region. |
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Keywords: | Electron paramagnetic resonance (EPR) Metal-oxide-semiconductor (MOS) |
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