| VXI边界扫描模块接口电路的设计 |
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| 引用本文： | 莫太平,刘磊. VXI边界扫描模块接口电路的设计[J]. 无线电通信技术, 2007, 33(5): 41-43 |
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| 作者姓名： | 莫太平 刘磊 |
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| 作者单位： | 1. 西安电子科技大学,机电工程学院,陕西,西安,710071
2. 桂林电子科技大学,广西,桂林,541004 |
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| 摘 要： | 根据IEEE1149.X标准和VXI总线规范,采用EDA技术对VXI边界扫描模块的接口电路进行了研究和设计,通过仿真和实际测试验证了设计的正确性,很好地将VXI总线技术和边界扫描技术融合在一起,成功研制了一种符合IEEE1149.X标准的C尺寸VXI边界扫描模块。在VXI总线测试领域拓展了边界扫描测试功能,不增加测试系统的成本和复杂性,解决了VXI总线应用领域集成电路的测试问题。
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| 关 键 词： | VXI模块 边界扫描 接口电路 |
| 文章编号： | 1003-3114（2007）05-41-3 |
| 修稿时间： | 2007-03-16 |
Design of Interface Circuit of BS Module on VXIbus |
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| MO Tai-ping,LIU Lei. Design of Interface Circuit of BS Module on VXIbus[J]. Radio Communications Technology, 2007, 33(5): 41-43 |
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| Authors: | MO Tai-ping LIU Lei |
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| Abstract: | In this paper,according to IEEE Std1149.X and VXIbus specification,the interface circuit of BS(Boundary Scan)module on Vxibus is studied and designed by using EDA technology.The design results are verified by simulating and testing.In addition,its correctness also shows that VXIbus technology can be well combined with BS technology.And a kind of VXI BS C-size module conforming to IEEE Std1149.X is developed.So the function of boundary scan is expanded in VXIbus test field,and it can resolve the problem of integrated circuit test in the test field of VXI without increasing the cost and complexity of system. |
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| Keywords: | VXI module BS interface circuit |
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