An apparatus for infrared transmittance and reflectance measurements at cryogenic temperatures |
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Authors: | Z. M. Zhang L. M. Hanssen R. U. Datla H. D. Drew |
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Affiliation: | (1) Department of Mechanical Engineering, University of Florida Gainesville, 32611 Florida, USA;(2) Radiometric Physics Division, National Institute of Standards and Technology, 20899 Gaithersburg, Maryand, USA;(3) Department of Physics, University of Maryland, 20742 College Park, Maryland, USA |
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Abstract: | A facility for measuring the optical properties of solid materials at cryogenic temperatures is being developed at the National Institute of Standards and Technology. A cryostat that houses four ur bolometric detectors and a six-position sample holder was designed and built. The bolometers operate near 5 K, and the sample temperature can he varied from 6 to 100 K. The beam from a Fourier transform spectrometer is directed to the cryostat by reflective optical components. The measurable wavelengths extend from 1m to 1 mm, with appropriate sources and beamsplitters in the spectrometer as well as windows and detectors in the cryostat. The angle of incidence on the sample ranges from 7.5 to 60. The mechanical electrical, and optical designs are described in this paper. Initial measurement results at wavelengths from 2 to 30m and a sample temperature of 10 K are presented. |
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Keywords: | cryogenics radiative properties reflectance transmittance |
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