Radiation damage (blistering) in Al,Cu, Si by exposure to a plasma focus discharge

Plates of Al, Cu (polycrystalline) and Si (monocrystal) have been irradiated with beams of D⁺ ions (keV to MeV) and other radiation by exposure to a single discharge of a 5–10-kJ Plasma Focus in deuterium. Scanning electron microscope and elemental X-ray energy dispersive analysis are used for diagnostics. The nonuniformity of the ion beam causes a nonuniform damage with formation of clusters of blisters. A statistical analysis of blister parameters (diameter and skin thickness) is used to investigate the internal structure of a deuteron beam ejected from the plasma. The value K ～ 10–20 keV is obtained as the typical ion energy for the bulk of the deuterons and an ion energy E ～ 200–230 keV is typical for individual ion groups (ion strings) forming the high-energy deuteron beam.