Determination par fluorescence x du phosphore incorpore dans les films anodiques d'aluminium et de niobium formes en milieu phosphorique |
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| Authors: | R. Bador G. Bouyssoux M. Romand |
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| Affiliation: | Laboratoire de Physique Pharmaceutique, Université Claude Bernard, Lyon I, France;Laboratoire de Chimie Appliquée (C.N.R.S., E.R.A. n° 300) Université Claude Bernard, Lyon I, France |
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| Abstract: | The incorporation of phosphorus impurities from phosphoric acid baths into the dielectric films formed on aluminium and niobium by anodic polarisation have been studied by X-ray fluorescence analysis. Results are discussed in relation to the metallic substrate and electrochemical parameters such as acid concentration, apparent current density and limiting voltage of film formation. |
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