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Influence of annealing on the phase composition,transmission and resistivity of SnOx thin films
Authors:G Beensh-Marchwicka  L Kròl-Stȩpniewska  A Misiuk
Affiliation:Institute of Electron Technology of Wroc?aw, Technical University, Janiszewskiego 11-17, 50-372 Wroc?aw, Poland
Abstract:Undoped and antimony-doped tin oxide films were prepared by d.c. reactive ion sputtering in an argon atmosphere with oxygen partial pressures ranging from 0 to 50%. The films were annealed in air, nitrogen and a vacuum in the temperature range 570–750 K. The influence of thermal annealing on the structural properties, electrical resistance and optical transmittance is described.
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